Tobias Pfingsten. Bayesian Active Learning for Sensitivity Analysis. In Johannes Fürnkranz, Tobias Scheffer, Myra Spiliopoulou, editors, Machine Learning: ECML 2006, 17th European Conference on Machine Learning, Berlin, Germany, September 18-22, 2006, Proceedings. Volume 4212 of Lecture Notes in Computer Science, pages 353-364, Springer, 2006. [doi]
Abstract is missing.