On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity

Matthias Pflanz, K. Walther, Heinrich Theodor Vierhaus. On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 51-53, IEEE Computer Society, 2001. [doi]

Abstract

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