Fine-grained intercontact characterization in disruption-tolerant networks

Tiphaine Phe-Neau, Marcelo Dias de Amorim, Vania Conan. Fine-grained intercontact characterization in disruption-tolerant networks. In Proceedings of the 16th IEEE Symposium on Computers and Communications, ISCC 2011, Kerkyra, Corfu, Greece, June 28 - July 1, 2011. pages 271-276, IEEE, 2011. [doi]

Abstract

Abstract is missing.