Degradation study of single poly radiation sensors by monitoring charge trapping

Evgeny Pikhay, Yakov Roizin, Yael Nemirovsky. Degradation study of single poly radiation sensors by monitoring charge trapping. Microelectronics Reliability, 59:18-25, 2016. [doi]

Authors

Evgeny Pikhay

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Yakov Roizin

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Yael Nemirovsky

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