Evgeny Pikhay, Yakov Roizin, Yael Nemirovsky. Degradation study of single poly radiation sensors by monitoring charge trapping. Microelectronics Reliability, 59:18-25, 2016. [doi]
@article{PikhayRN16,
title = {Degradation study of single poly radiation sensors by monitoring charge trapping},
author = {Evgeny Pikhay and Yakov Roizin and Yael Nemirovsky},
year = {2016},
doi = {10.1016/j.microrel.2015.12.032},
url = {http://dx.doi.org/10.1016/j.microrel.2015.12.032},
researchr = {https://researchr.org/publication/PikhayRN16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {59},
pages = {18-25},
}