Herold Pilo, R. Dean Adams, Robert E. Busch, Eric A. Nelson, Geoerge E. Rudgers. Bitline contacts in high density SRAMs: design for testability and stressability. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 776-782, IEEE Computer Society, 2001.
Abstract is missing.