J. F. Poage, Edward J. McCluskey. Derivation of optimum test sequences for sequential machines. In Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design, 11-13 November 1964, Princeton, New Jersey, USA. pages 121-132, IEEE, 1964.
@inproceedings{PoageM64, title = {Derivation of optimum test sequences for sequential machines}, author = {J. F. Poage and Edward J. McCluskey}, year = {1964}, tags = {testing}, researchr = {https://researchr.org/publication/PoageM64}, cites = {0}, citedby = {0}, pages = {121-132}, booktitle = {Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design, 11-13 November 1964, Princeton, New Jersey, USA}, publisher = {IEEE}, }