CMOS IC diagnostics using the luminescence of OFF-state leakage currents

Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho. CMOS IC diagnostics using the luminescence of OFF-state leakage currents. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 134-139, IEEE, 2004. [doi]

Abstract

Abstract is missing.