Thomas Polzer, Florian Huemer, Andreas Steininger. Refined metastability characterization using a time-to-digital converter. Microelectronics Reliability, 80:91-99, 2018. [doi]
@article{PolzerHS18,
title = {Refined metastability characterization using a time-to-digital converter},
author = {Thomas Polzer and Florian Huemer and Andreas Steininger},
year = {2018},
doi = {10.1016/j.microrel.2017.11.017},
url = {https://doi.org/10.1016/j.microrel.2017.11.017},
researchr = {https://researchr.org/publication/PolzerHS18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {80},
pages = {91-99},
}