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Thomas Polzer, Florian Huemer, Andreas Steininger. Refined metastability characterization using a time-to-digital converter. Microelectronics Reliability, 80:91-99, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Using a Duplex Time-to-Digital Converter for Metastability Characterization of an FPGAFlorian Huemer, Thomas Polzer, Andreas Steininger. ddecs 2018: 141-146 [doi] Measuring metastability using a time-to-digital converterThomas Polzer, Florian Huemer, Andreas Steininger. ddecs 2017: 116-121 [doi] Metastability-Aware Memory-Efficient Time-to-Digital ConvertersMatthias Függer, Attila Kinali, Christoph Lenzen, Thomas Polzer. async 2017: 49-56 [doi]
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