Irith Pomeranz. Piecewise-functional broadside tests based on intersections of reachable states. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 133-138, IEEE, 2015. [doi]
Abstract is missing.