Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation - researchr publication

researchr

You are not signed in
Sign in
Sign up

Irith Pomeranz. Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-7, IEEE, 2019. [doi]

Abstract is missing.

runs on WebDSL