Irith Pomeranz. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.