A Postprocessing Procedure to Reduce the Number of Different Test Lengths in a Test Set for Scan Circuits - researchr publication

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Irith Pomeranz, Sudhakar M. Reddy. A Postprocessing Procedure to Reduce the Number of Different Test Lengths in a Test Set for Scan Circuits. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 131-136, IEEE Computer Society, 2001. [doi]

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