On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations - researchr publication

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Irith Pomeranz, Sudhakar M. Reddy. On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 211-220, IEEE Computer Society, 2001.

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