Forming N-detection test sets from one-detection test sets without test generation

Irith Pomeranz, Sudhakar M. Reddy. Forming N-detection test sets from one-detection test sets without test generation. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

Abstract

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