Irith Pomeranz, Sudhakar M. Reddy. On test generation by input cube avoidance. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 522-527, ACM, 2007. [doi]
Abstract is missing.