Irith Pomeranz, Sudhakar M. Reddy. Partitioned n-detection test generation. In Fabrizio Lombardi, Sanjukta Bhanja, Yehia Massoud, R. Iris Bahar, editors, Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009. pages 93-98, ACM, 2009. [doi]
Abstract is missing.