Irith Pomeranz, Sudhakar M. Reddy. On-chip Generation of the Second Primary Input Vectors of Broadside Tests. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 38-46, IEEE Computer Society, 2009. [doi]
Abstract is missing.