Irith Pomeranz, Sudhakar M. Reddy. Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test Sequences. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 358-366, IEEE Computer Society, 2009. [doi]
Abstract is missing.