Irith Pomeranz, Nirmal R. Saxena, Richard Reeve, Paritosh Kulkarni, Yan A. Li. Generation of Test Cases for Hardware Design Verification of a Super-Scalar Fetch Processor. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 904-913, IEEE Computer Society, 1996.
Abstract is missing.