SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer

M.-C. Poon, Y. Gao, T. C. W. Kok, A. M. Myasnikov, Hei Wong. SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer. Microelectronics Reliability, 41(12):2071-2074, 2001. [doi]

Abstract

Abstract is missing.