Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
M. Porti, S. Meli, M. Nafría, X. Aymerich. Pre-breakdown noise in electrically stressed thin SiO::2:: layers of MOS devices observed with C-AFM. Microelectronics Reliability, 43(8):1203-1209, 2003. [doi]
Abstract is missing.