V. Pouget, Pascal Fouillat, D. Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet. An Overview of the Applications of a Pulsed Laser System for SEU Testing. In 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain. pages 52, IEEE Computer Society, 2000. [doi]
@inproceedings{PougetFLLSRDE00,
title = {An Overview of the Applications of a Pulsed Laser System for SEU Testing},
author = {V. Pouget and Pascal Fouillat and D. Lewis and Hervé Lapuyade and L. Sarger and F. M. Roche and S. Duzellier and R. Ecoffet},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2000/0646/00/06460052abs.htm},
tags = {testing, Pascal},
researchr = {https://researchr.org/publication/PougetFLLSRDE00},
cites = {0},
citedby = {0},
pages = {52},
booktitle = {6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain},
publisher = {IEEE Computer Society},
isbn = {0-7695-0646-1},
}