Peyman Pouyan, Esteve Amat, Antonio Rubio. Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 240-245, IEEE, 2012. [doi]
Abstract is missing.