Denduang Pradubsuwun, Tomohiro Yoneda, Chris J. Myers. Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits. In Farn Wang, editor, Automated Technology for Verification and Analysis: Second International Conference, ATVA 2004, Taipei, Taiwan, ROC, October 31-November 3, 2004. Proceedings. Volume 3299 of Lecture Notes in Computer Science, pages 339-353, Springer, 2004. [doi]
Abstract is missing.