A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS

Jeffrey Prinzie, Michiel Steyaert, Paul Leroux, Jorgen Christiansen, Paulo Moreira. A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2016, Toyama, Japan, November 7-9, 2016. pages 285-288, IEEE, 2016. [doi]

Abstract

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