Hugo Pues, Ben Brike, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, Dries Vande Ginste. Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 249-253, IEEE, 2013. [doi]
Abstract is missing.