MET 2017 Workshop Summary

Laura L. Pullum, Dave Towey, Upulee Kanewala, Chang-ai Sun, Márcio Eduardo Delamaro. MET 2017 Workshop Summary. In 2nd IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2017, Buenos Aires, Argentina, May 22, 2017. pages 1, IEEE Computer Society, 2017. [doi]

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