基于机器视觉的液晶屏Mura缺陷检测方法 (Machine Vision Based Inspection Method of Mura Defect for LCD)

Jide Qian, Bin Chen, Jiye Qian, Hengjun Zhao, Gang Chen. 基于机器视觉的液晶屏Mura缺陷检测方法 (Machine Vision Based Inspection Method of Mura Defect for LCD). 计算机科学, 45(6):296-300, 2018. [doi]

Abstract

Abstract is missing.