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Jide Qian, Bin Chen, Jiye Qian, Hengjun Zhao, Gang Chen. 基于机器视觉的液晶屏Mura缺陷检测方法 (Machine Vision Based Inspection Method of Mura Defect for LCD). 计算机科学, 45(6):296-300, 2018. [doi]
Abstract is missing.