Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices

Qinsong Qian, Siyang Liu, Weifeng Sun, Hu Sun. Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices. Microelectronics Journal, 42(5):609-613, 2011. [doi]

Abstract

Abstract is missing.