Peeler: Learning to Effectively Predict Flakiness without Running Tests

Yihao Qin, Shangwen Wang, Kui Liu, Bo Lin, Hongjun Wu, Li Li 0029, Xiaoguang Mao, Tegawendé F. Bissyandé. Peeler: Learning to Effectively Predict Flakiness without Running Tests. In IEEE International Conference on Software Maintenance and Evolution, ICSME 2022, Limassol, Cyprus, October 3-7, 2022. pages 257-268, IEEE, 2022. [doi]

Abstract

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