Gang Qu 0001, Benjamin Tan 0001, Kuheli Pratihar, Debdeep Mukhopadhyay, Ramesh Karri. Innovation Practices Track: Security in Test and Test for Security. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1, IEEE, 2022. [doi]
Abstract is missing.