Removing Imaging Artifacts in Electron Microscopy using an Asymmetrically Cyclic Adversarial Network without Paired Training Data

Tran Minh Quan, David Grant Colburn Hildebrand, Kanggeun Lee, Logan A. Thomas, Aaron T. Kuan, Wei-Chung Allen Lee, Won-Ki Jeong. Removing Imaging Artifacts in Electron Microscopy using an Asymmetrically Cyclic Adversarial Network without Paired Training Data. In 2019 IEEE/CVF International Conference on Computer Vision Workshops, ICCV Workshops 2019, Seoul, Korea (South), October 27-28, 2019. pages 3804-3813, IEEE, 2019. [doi]

Abstract

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