Dynamic Reference Voltage Sensing Scheme for Read Margin Improvement in STT-MRAMs

Kien Trinh Quang, Sergio Ruocco, Massimo Alioto. Dynamic Reference Voltage Sensing Scheme for Read Margin Improvement in STT-MRAMs. IEEE Trans. on Circuits and Systems, 65-I(4):1269-1278, 2018. [doi]

Abstract

Abstract is missing.