Microarchitecture-Based Introspection: A Technique for Transient-Fault Tolerance in Microprocessors

Moinuddin K. Qureshi, Onur Mutlu, Yale N. Patt. Microarchitecture-Based Introspection: A Technique for Transient-Fault Tolerance in Microprocessors. In 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings. pages 434-443, IEEE Computer Society, 2005. [doi]

Abstract

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