Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT

Laavanya Rachakonda, Saraju P. Mohanty, Elias Kougianos, Prabha Sundaravadivel. Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT. IEEE Trans. Consumer Electronics, 65(4):474-483, 2019. [doi]

Abstract

Abstract is missing.