Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI

Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin. Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 195-198, IEEE, 2021. [doi]

Abstract

Abstract is missing.