Stefan Radtke, Jens Bargfrede, Walter Anheier. Distributed automatic test pattern generation with a parallel FAN algorithm. In 1995 International Conference on Computer Design (ICCD 95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings. pages 698, IEEE Computer Society, 1995. [doi]
Abstract is missing.