Aparna S. Raghunath, K. T. Sreekumar, C. Santhosh Kumar, K. I. Ramachandran. Improving Speed Independent Performance of Fault Diagnosis Systems through Feature Mapping and Normalization. In 15th IEEE International Conference on Machine Learning and Applications, ICMLA 2016, Anaheim, CA, USA, December 18-20, 2016. pages 764-767, IEEE, 2016. [doi]
Abstract is missing.