Habibur Rahaman, Santanu Chattopadhyay, Indranil Sengupta 0001. A Deep Neural Network Guided Testing Approach for Finite State Machines. In 4th International Symposium on Devices, Circuits and Systems, ISDCS 2021, Higashi-Hiroshima, Japan, March 3-5, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.