From VSC Attributes and Characteristics to SCM Challenges

Tua Rahikkala, Veikko Seppänen. From VSC Attributes and Characteristics to SCM Challenges. In 26th EUROMICRO 2000 Conference, Informatics: Inventing the Future, 5-7 September 2000, Maastricht, The Netherlands. pages 2308, IEEE Computer Society, 2000. [doi]

Abstract

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