An Approach to Tolerate Process Related Variations in Memristor-Based Applications

Jeyavijayan Rajendran, Harika Manem, Ramesh Karri, Garrett S. Rose. An Approach to Tolerate Process Related Variations in Memristor-Based Applications. In VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011. pages 18-23, IEEE, 2011. [doi]

Abstract

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