Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park. An analysis and testing of operation induced faults in MOS VLSI. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 137-142, IEEE, 1991. [doi]
Abstract is missing.