Madhav Rao. Electrical Modeling and Characterization of Copper/Carbon Nanotubes in Tapered through Silicon Vias. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 366-371, IEEE Computer Society, 2017. [doi]
Abstract is missing.