M. Wasiur Rashid, Edwin J. Tan, Michael C. Huang, David H. Albonesi. Exploiting Coarse-Grain Verification Parallelism for Power-Efficient Fault Tolerance. In 14th International Conference on Parallel Architecture and Compilation Techniques (PACT 2005), 17-21 September 2005, St. Louis, MO, USA. pages 315-328, IEEE Computer Society, 2005. [doi]
Abstract is missing.