Christian Ratzenbock, Johann Emhofer, Christian Maszl, Thomas Fleckl. Development of an advanced software for a single aperture Defocusing Micro Particle Tracking Velocimetry application. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 2401-2407, IEEE, 2013. [doi]
Abstract is missing.