Circuit to reduce Gate Induced Drain Leakage in CMOS output buffers

Hari Anand Ravi, Mayank Goel, Prasad Bhilawadi. Circuit to reduce Gate Induced Drain Leakage in CMOS output buffers. In Lorena Garcia, editor, 22nd International Conference on Very Large Scale Integration, VLSI-SoC, Playa del Carmen, Mexico, October 6-8, 2014. pages 1-5, IEEE, 2014. [doi]

Abstract

Abstract is missing.