Ali Rebhi, S. Abid, Farhat Fnaiech. Fabric defect detection using local homogeneity and morphological image processing. In International Image Processing, Applications and Systems, IPAS 2016, Hammamet, Tunisia, November 5-7, 2016. pages 1-5, IEEE, 2016. [doi]
No references recorded for this publication.
No citations of this publication recorded.