Remata S. Reddy, Irith Pomeranz, Sudhakar M. Reddy, Seiji Kajihara. Compact test generation for bridging faults under I/sub DDQ/ testing. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 310-316, IEEE Computer Society, 1995. [doi]
Abstract is missing.